Kelvin probe force microscopy (KPFM)
Kelvin probe force microscopy (KPFM) The object of the tender process was a Kelvin probe force microscopy (KPFM) equipped with atomic force microscopy (AFM) functionality, a state-of-the-art detector system, and equipment for advanced material surface potential mapping with an efficient spatial resolution and a minimum of topographical artifacts (later also “Equipment”). The equipment supports both AM- and FM-KPFM modes, operate with a potential range up to ±10 V, with a reasonable spatial resolution. The applied voltage is from a few hundred millivolts to a few volts (approximately 1-2 V) f…
- Ostaja
- VTT Technical Research Centre of Finland Ltd
- Julkaistu
- 2026-09-13
- Arvo
- 177 100 EUR
- Suorituspaikka
- Uusimaa
- Ilmoitus
- 56897
Voittajat ja hankinnan osat
Kelvin probe force microscopy (KPFM)
The object of the tender process was a Kelvin probe force microscopy (KPFM) equipped with atomic force microscopy (AFM) functionality, a state-of-the-art detector system, and equipment for advanced material surface potential mapping with an efficient spatial resolution and a minimum of topographical artifacts (later also “Equipment”). The equipment supports both AM- and FM-KPFM modes, operate with a potential range up to ±10 V, with a reasonable spatial resolution. The applied voltage is from …
- Concept Scientific Instruments (00489 629 030.) – 177 100 €